Location
CREOL Rm 180
Description
The Nikon Eclipse L150 is a compact, ESD-safe industrial microscope optimized for semiconductor and materials science applications. It supports various reflected light contrast techniques—brightfield, darkfield, Nomarski DIC, and basic polarization—and features a trinocular head for camera integration. Ideal for wafer-level inspection, it combines high optical performance with ergonomic controls.
Configuration/Specifications
5MP Excelis digital camera and CaptaVision software
Observation Modes: Reflected brightfield, darkfield, Nomarski DIC, basic polarization
Objectives: 5×, 20×, 50×, 100x, 200x
Eyepieces: L-W10x/22
Substrate size
up to 6″
Operations Manual
CaptaVision Software
Make
Nikon
Model
Eclipse L150
Rate
CREOL Facility Use