Location
CREOL Rm 180
Description
The Filmetrics F20 is a versatile, benchtop thin-film measurement system designed for rapid and precise characterization of film thickness and optical constants (refractive index n and extinction coefficient k). Utilizing spectroscopic reflectometry, it delivers sub-second measurements and supports a wide range of applications, including semiconductors, optics, biomedical devices, and advanced materials research. The system connects via USB to a Windows® computer and includes FILMeasure software for intuitive data acquisition and analysis.
Configuration/Specifications
Film thickness range: 15 nm to 70 µm
Refractive index (n) and extinction coefficient (k) measurement
Spectral range: 380–1050 nm
Accuracy: Greater of 10 Å or 0.4%
Substrate size
N/A
Standard Operating Procedure
Make
Filmetrics
Model
F20
Rate
CREOL Facility Use